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1.
Regular marked price:
$99.95
Discount Price:
$79.96
Cost Savings:
$19.99 (20%)
Price fluctuation possible.
High Resolution X-Ray Diffractometry and Topography
Author name:
BRIAN K.TANNER
April 16, 2007
2.
Discount Price:
$281.00
Price fluctuation possible.
X-Ray and Neutron Dynamical Diffraction: Theory and Applications (NATO Science Series: B:)
from: Springer
January 31, 1997
3.
Discount Price:
$139.95
Price fluctuation possible.
X-Ray Metrology in Semiconductor Manufacturing
Author name:
D. Keith Bowen
,
Brian K. Tanner
January 24, 2006
4.
Discount Price:
$120.00
Price fluctuation possible.
Introduction to the Physics of Electrons in Solids
Author name:
Brian K. Tanner
April 28, 1995
5.
X-Ray Diffraction Topography (International series in the science of the solid state ; v. 10)
Author name:
Brian K. Tanner
1976-06
6.
Characterization of Crystal Growth Defects by X-Ray Methods.
Author name:
Brian K. Tanner
1980
7.
Characterization of Crystal Growth Defects by X-Ray Methods.
Author name:
Brian K. Tanner
1981
8.
X-Ray and Neutron Dynamical Diffraction, Theory and Applications - Proceedings of a NATO ASI Held in Erice, Italy, April 9-21, 1996
Author name:
Andre;Lagomarsino, Stefano;Tanner, Brian K., Authier
1997
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